Scanning Electron Microscope with EDX (SEM-EDX)

Field Emission Scanning Electron Microscope (FESEM)

Ion Milling for SEM & TEM Sample Preparation

Fourier Transform Infrared Spectroscopy (FTIR)

Scanning Acoustic Microscopy (SAM)

Dual FIB-SEM (Galium Source)

Plasma FIB-SEM (Xenon Souce)

3D Micro CT Scan

2D X-ray Imaging

Raman / AFM SEM

Transmission Electron Micrsocopy (TEM)

Optical Microscopy

Particle Size Analyzer (PSA)

Surface Profilometer

Ion Chromatography

ICP-OES

Atomic Absorption Spectroscopy

Volatile Organic Compound (VOC)

Optical Emission Spectroscopy

Cross-section Preparation

Electron Backscatter Diffraction (EBSD)

CHNS/O Elemental Analysis

TOF-SIMS

Visual Examination

Macroscopic Examination

Metallurgical Analysis

Macroscopic Examination

Metallurgical Analysis

Metallography

Root Cause Investigation

UV-Visible

X-ray Diffraction Analysis (XDR)

X-ray Fluorescence (XRF)

X-ray Photoelectron Spectroscopy (XPS)

Gas Chromatorgraphy Mass Spectrography (GC-MS)

Arc Spark OES

Sputter Coating

Thermogravimetric Analysis (TGA)

Differential Scanning Calorimetry

Stereomicroscopic Examination

Electrical Verification

Thermal Emission Microscopy

Biology Sample Preparation

Scanning Transmission Electron Microscope (STEM)

Decapsulation

Fault Isolation:

Hot Spot

Photo Emission

Contact Angle Measurement

Salt Spray Test

Thermal Shock

Temperature / Humidity Cycling

Vibration / Mechanical Shock

High Temperature Oven

Solderability