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TESCAN SEM/FIB-SEM with integrated Raman spectrometer
TESCAN SEM/FIB-SEM with integrated Raman spectrometer
Key features
Key features
- Quick and convenient switching between SEM and Raman measurement
- Automated sample transfer from one measuring position to the other
- Integrated software interface for user-friendly measurement control
- Correlation of the measurement results and image overlay
- No compromise in SEM and Raman imaging capabilities
- Raman microscopy provides analysis of chemical compounds and material characteristics (stress, orientation, crystallinity).
- Raman spectroscopy is a complementary method to EDX.
TIMA-X TESCAN Integrated Mineral Analyser
TIMA-X TESCAN Integrated Mineral Analyser
Key Hardware Features
Key Hardware Features
- Based on TESCAN MIRA Schottky field emission or VEGA thermionic emission SEM
- Up to four integrated EDX detectors for maximum system throughput performance
- Latest generation of Peltier-cooled SDD detectors
- New 30 mm2 SDD CMOS vacuum encapsulated chip
- Si3N4 ceramic window is rugged, non-porous and has high transmissivity
- Compatible with full-function standards-based quantitative EDX analysis
Unique Features
Unique Features
- Complete hardware integration of the X-ray acquisition and beam scanning system
- AutoLoader™ for 24/7 continuous and unattended automated operations of large sample sets
- Summing of low-count spectra for lower detection limits
- Direct quantitative EDX analysis of TIMA measured X-ray spectra
- Workflow and tools for simpler building of mineral classification schemes
- Interactive measurement validations and investigation tools
TESCAN MIRA 3 AMU
TESCAN MIRA 3 AMU
AMU chamber highlights
AMU chamber highlights
- High performance FE-SEM system equipped with an extraordinarily large chamber
- Chamber internal dimensions: 880 mm (width) × 1200 mm (depth)
- Maximum specimen weight: 25 Kg
- Integrated active vibration isolation
- Capable of low and high vacuum operations
- Multiple detector configuration possible
Applications
Applications
- Life Sciences
- large biological specimens imaging,analysis of whole bones
- Materials science
- characterisation of whole large samples, wearing and fatigue studies,failure analysis, forensics
- Earth sciences
- study and characterisation of minerals,whole rocks and valuable geological samples whose integral structure must be preserved for the analysis
- Semiconductors and Microelectronics
- large wafer SEM inspection (maximum sample diameter 30”)
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