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CIQTEK Ultra-High FESEM SEM5000X
CIQTEK Ultra-High FESEM SEM5000X
Key features
Key features
CIQTEK SEM5000X Ultra-High Resolution Field Emission Scanning Electron Microscope (FE-SEM) is a high-performance analytical system designed for ultra-high resolution imaging and advanced materials characterization. Equipped with a Schottky field emission electron source and optimized electron optics, the SEM5000X delivers exceptional image clarity, stability, and analytical capability. Its intelligent control system, flexible detection configuration, and automated functions make it an ideal solution for research institutes, semiconductor analysis, nanotechnology, and advanced industrial applications.
Ultra-high resolution imaging with field emission electron source, delivering excellent surface detail at nanometer scale for advanced material analysis
Schottky field emission gun (FEG) ensures high brightness, strong beam stability, and long service life
Advanced electron optical system design for improved signal collection efficiency and superior image quality at both low and high accelerating voltages
High-resolution performance at low kV, enabling clear imaging of beam-sensitive and non-conductive samples
Multiple detection modes including SE and BSE detectors, providing comprehensive topographic and compositional information
Supports high-end analytical integrations such as EDS, EBSD, and other advanced detectors for elemental and crystallographic analysis
Large chamber design with flexible sample handling and compatibility for various sample sizes and accessories
Motorized stage with high precision control for accurate positioning and efficient sample navigation
Intelligent auto-functions including auto focus, auto stigmation, and auto brightness/contrast for simplified operation and improved productivity
Stable and efficient vacuum system ensuring fast pump-down time and consistent imaging conditions
User-friendly software interface with integrated control, imaging, and analysis functions
Modular system architecture allowing customization and future upgrades based on application requirements
Designed for applications in materials science, semiconductors, nanotechnology, life sciences, and failure analysis
ZEPTOOLS Ultra Emission Desktop - FE SEM
ZEPTOOLS Ultra Emission Desktop - FE SEM
Key features
Key features
ZEM Ultra Field Emission Desktop Scanning Electron Microscope (FE-SEM) is a high-resolution analytical system designed for precise micro- and nano-scale characterization. Equipped with a Schottky field emission electron source and a three-stage independent vacuum system, the ZEM delivers excellent imaging performance and operational stability. Its compact desktop design, automated functions, and flexible analytical expansion make it suitable for research laboratories, materials analysis, and advanced inspection applications.
Schottky field emission electron source (FEG) providing high brightness, excellent beam stability, and superior imaging performance
Ultra-high resolution below 2.5 nm, enabling detailed observation of micro- and nano-scale structures
Advanced three-stage independent vacuum system ensuring stable operation and consistent imaging conditions
Designed with large sample chamber and stage capacity, supporting a wide range of sample sizes
Supports in-situ functional sample stage, enabling advanced experimental and analytical workflows
Compatible with EDS and EBSD systems for elemental and crystallographic analysis (optional configuration)
Fully automated operation including auto focus and system optimization for improved efficiency
User-friendly interface for easy operation, suitable for both new and experienced users
High system stability and reliability for long-term analytical performance
Compact desktop design ideal for laboratories with limited space
Modular design allowing flexible expansion and customization based on application needs
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