4D STEM

TESCAN TENSOR is the world’s first dedicated 4D-STEM

• Multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.

• Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.

• Integrated, Near Real-Time 4D-STEM data Analysis and Processing

• Performance benefits from Electron Beam Precession and near-UHV

• A novel approach to STEM User Experience