Multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.
Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.
Integrated, Near Real-Time 4D-STEM data Analysis and Processing
Performance benefits from Electron Beam Precession and near-UHV
A novel approach to STEM User Experience