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High Resolution 3D X-ray Microscopy

nanoVoxel 2000

With world-leading spatial resolution and contrast, this system can analysis the inner micro-structure of sample.
The original structure can be retained by using this equipment and the detector system can satisfy different requirements of spatial resolution.
The scanned 3D data can provide high resolution 3D/4D solutions.
Dual optical paths can provide users for the flexible solutions of cross-scale sample test and large cabient can allow in situ experiment appliance to be integrated in this system.
Compact structure and small occupied area.
Simple operation mode of this system is easy for users to handle.

With 500nm spatial resolution and minimum 70nm voxel size, this system has excellent 3D imaging and image analysis ability, especially for the phase contrast and sub-pixel imaging.
Unprecedented image quality can show the inner structure perfectly, and the scanned data can provide solutions for the evaluation and improvement of material property and processing.
Dual optical paths can provide users for the flexible solutions of cross-scale sample test and large cabient can allow in situ experiment appliance to be integrated in this system.
High mechanical stability can be guaranteed by the displacement stage and air-floating rotation stage with nano accuracy.
Compared to the nanoVoxel-2000 series, the test efficiency can be improved greatly for the sub-micron scanning.
Excellent low voltage property of X-ray source is more suitable for the lightweight or biological samples.

nanoVoxel 4000 series is a high power micro-CT system by using high voltage X-ray source (225kV, 240 kV and 300 kV are optional) with micro focal spot and highly sensitive detector including different kinds of big size panel detectors and lens coupling CCD.
Large cabient space for big size sample and in situ experiment appliance;
Sub-micron spatial resolution (≤0.5μm) for the fine test of micro-structure;
High penetrating power (equivalent steel thickness (40-53)mm) for the high efficient test of the high density and large size sample;
CAD data matching, geometrical shape of the complicated structure can be 3D measurement.

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