Key Features

CIQTEK TH-F120 Field Emission Transmission Electron Microscope (FE-TEM) is a high-performance analytical system designed for atomic-scale imaging and advanced materials characterization. Equipped with a field emission electron source and stable optical system, it delivers high-resolution imaging, diffraction, and compositional analysis for research, semiconductor, and nanotechnology applications.

• High-brightness field emission electron gun (FEG) for superior beam stability and resolution

• Delivers high-resolution imaging at nanoscale and atomic level

• Supports multiple imaging modes including TEM and STEM for versatile analysis

• Advanced electron optical system ensuring precise beam control and imaging performance

• Enables selected area electron diffraction (SAED) for crystal structure analysis

• Compatible with EDS and other analytical detectors for elemental characterization

• High-stability column design to minimize vibration and drift

• User-friendly software for integrated imaging, analysis, and data processing

• Automated alignment and operation for efficient workflow and ease of use

• Flexible configuration for future upgrades and advanced research applications