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CIQTEK Tungsten Filament SEM | SEM 3300
CIQTEK Tungsten Filament SEM | SEM 3300
Key features
Key features
CIQTEK SEM3300 Tungsten Filament Scanning Electron Microscope (SEM) is a reliable and versatile analytical system designed for routine imaging and materials analysis. Equipped with a tungsten filament electron source and optimized electron optics, the SEM3300 delivers stable imaging performance and flexible operation. With its user-friendly interface, automated functions, and configurable analytical capabilities, it is well-suited for laboratories in research, quality control, and industrial inspection.
Tungsten filament electron source providing stable and cost-effective performance for routine SEM applications
Optimized electron optical system for clear imaging and reliable performance across a wide range of samples
Supports SE and BSE detectors, enabling both surface morphology and compositional contrast analysis
Capable of low vacuum operation, allowing observation of non-conductive samples with minimal preparation
Compatible with EDS system for elemental composition analysis (optional configuration)
Motorized stage with multi-axis control for precise sample positioning and efficient navigation
Intelligent auto-functions including auto focus, auto stigmation, and auto brightness/contrast for improved ease of use
Stable and efficient vacuum system ensuring consistent imaging conditions and fast pump-down
User-friendly software interface integrating imaging and analysis into a streamlined workflow
Modular design allowing flexible configuration and future upgrades based on application needs
Designed for applications in materials science, electronics, education, quality control, and industrial inspection
CIQTEK Tungsten Filament SEM | SEM 3200
CIQTEK Tungsten Filament SEM | SEM 3200
Key features
Key features
CIQTEK SEM3200 Tungsten Filament Scanning Electron Microscope (SEM) is a reliable and cost-effective analytical system designed for routine imaging and material analysis. Featuring a tungsten filament electron source and optimized electron optics, the SEM3200 provides stable imaging performance with flexible operation. Its user-friendly interface, automated functions, and expandable analytical capabilities make it suitable for education, research, and industrial quality control applications.
Tungsten filament electron source delivering stable and economical performance for routine SEM applications
Optimized electron optical system for consistent image quality across various sample types
Supports secondary electron (SE) and backscattered electron (BSE) detection for both surface morphology and compositional contrast
Capable of low vacuum operation, allowing observation of non-conductive samples with minimal preparation
Compatible with EDS system for elemental composition analysis (optional configuration)
Motorized stage with multi-axis control for accurate sample positioning and efficient navigation
Intelligent auto-functions including auto focus, auto stigmation, and auto brightness/contrast for simplified operation
Stable and efficient vacuum system ensuring reliable imaging conditions and fast pump-down time
User-friendly software interface integrating imaging and analysis into a streamlined workflow
Modular design allowing flexible configuration and future upgrades
Ideal for applications in materials science, education, electronics inspection, and industrial quality control
CIQTEK Tungsten Filament SEM | SEM 2100
CIQTEK Tungsten Filament SEM | SEM 2100
Key features
Key features
CIQTEK SEM2100 Tungsten Filament Scanning Electron Microscope (SEM) is a compact and economical solution designed for routine imaging and basic material analysis. Featuring a tungsten filament electron source and stable electron optics, the SEM2100 delivers reliable performance for everyday laboratory use. Its simple operation, automated functions, and flexible configuration make it suitable for education, quality control, and general research applications.
Tungsten filament electron source providing stable and cost-effective performance for routine SEM applications
Optimized electron optical system for consistent and reliable imaging results
Supports secondary electron (SE) detection for surface morphology observation
Optional backscattered electron (BSE) detector for compositional contrast imaging
Compatible with EDS system for elemental analysis (optional configuration)
User-friendly interface designed for simple and efficient operation
Basic auto-functions including auto focus and image optimization for improved usability
Stable and efficient vacuum system ensuring consistent imaging conditions
Compact design suitable for laboratories with limited space
Flexible configuration allowing upgrade and expansion based on application needs
Ideal for applications in education, routine inspection, and basic materials analysis
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