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COXEM EM-40
COXEM EM-40
Key features
Key features
COXEM EM-40 tabletop scanning electron microscope (SEM) is COXEM’s latest tabletop SEM launched in 2024, designed to deliver fast, high-resolution imaging in a compact system. Powered by Nanostation V5 with 5th-generation signal processing, the EM-40 supports imaging speeds of up to 13 frames per second while maintaining clear image quality. Its intuitive graphical interface, motorized stage, and enhanced auto-focus function help simplify operation and improve workflow efficiency, making it suitable for both experienced users and first-time operators in research, inspection, and analytical environments.
High-resolution tabletop SEM with spatial resolution below 5 nm and magnification range from 13x to 250,000x.
Powered by Nanostation V5 with 5th-generation signal processing for ultra-fast imaging performance of up to 13 fps.
User-friendly intuitive GUI that combines imaging, analysis, and data management in one platform for a faster workflow.
Equipped with a 3-axis motorized X, Y, Z stage for smooth and precise sample navigation.
Features enhanced auto-focus and 1-second auto brightness & contrast for faster image optimization.
Supports SE and optional BSE detection, with optional analytical capabilities such as EDS, EBSD, and STEM.
Offers HV, LV, and VP vacuum modes, including variable pressure operation for stable imaging of non-conductive and non-coated samples.
Includes Automatic NaviCAM image saving for easier sample position tracking and image correlation.
Supports large area imaging with automatic stitching for wide-area, high-resolution sample analysis.
Provides optional advanced functions such as 3D reconstruction, nano-particle analysis, and cooling module support for biological samples.
Compact footprint with dimensions of 315 × 560 × 580 mm, making it suitable for laboratories with limited space.
COXEM EM-30N
COXEM EM-30N
Key features
Key features
COXEM EM-30N tabletop scanning electron microscope (SEM) is a compact and versatile SEM designed for high-quality imaging with simple operation. Equipped with a tungsten filament electron source and an intuitive user interface, the EM-30N delivers reliable performance for routine analysis and inspection. Its compact footprint, automated functions, and flexible vacuum modes make it an ideal solution for educational, industrial, and research environments.
High-quality imaging with tungsten filament electron source, providing stable performance for routine SEM applications
Magnification range up to 150,000x with clear surface detail for materials analysis and inspection
Supports SE and optional BSE detection, enabling both topographic and compositional contrast imaging
User-friendly interface designed for easy operation, suitable for both beginners and experienced users
Equipped with motorized stage (X, Y, Z) for precise and smooth sample navigation
Features auto focus and auto brightness/contrast for faster image optimization and improved workflow
Supports EDS integration for elemental analysis (optional configuration)
Offers high vacuum and low vacuum modes, allowing observation of non-conductive samples without coating
Compact tabletop design suitable for laboratories with limited space
Stable and efficient vacuum system ensuring consistent imaging performance
Ideal for applications in education, quality control, materials analysis, and industrial inspection
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