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CIQTEK SEM/FIB-SEM with integrated Raman spectrometer
CIQTEK SEM/FIB-SEM with integrated Raman spectrometer
Key features
Key features
Quick and convenient switching between SEM and Raman measurement
Automated sample transfer from one measuring position to the other
Integrated software interface for user-friendly measurement control
Correlation of the measurement results and image overlay
No compromise in SEM and Raman imaging capabilities
Raman microscopy provides analysis of chemical compounds and material characteristics (stress, orientation, crystallinity).
Raman spectroscopy is a complementary method to EDX.
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